DYNAMIC CHARACTERIZATION OF A/D CONVERTERS BY RAMP TESTING SIGNALS

Daniel Belega, Dominique Dallet

Abstract

In this paper a method for evaluation the dynamic performances of an analog-to-digital converter (ADC) by ramp testing signals is proposed. This method permits the estimation with high accuracy of ones of the most important dynamic parameters of an ADC – signal-to-noise and distortion ratio (SINAD) and effective number of bits (ENOB). Carried out simulations confirm that the proposed method leads to accurate results.

Keywords

ramp signals, modulo time-plot, estimation of the dynamic parameters SINAD and ENOB of an ADC

Download

PWC-2006-TC4-IWADC-001u.pdf

DOI

-

IMEKO TC

TC4 - Measurement of Electrical Quantities

Back to the proceedings