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UNCERTAINTY OF ESTIMATES OBTAINED WITH THE HISTOGRAM TEST OF ADCS

F. Corrêa Alegria, A. Cruz Serra

Abstract

We present here expressions to determine the uncertainty interval of the estimates of transition voltages and code bin widths of an analogue to digital converter obtained with the Standard Histogram Test. We consider the presence of additive noise as it influences the precision and causes a bias on the test results.

Keywords
Analogue to digital converter, Histogram Test, Uncertainty
Download
PWC-2006-TC4-IWADC-002u.pdf
DOI
-
IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
XVIII IMEKO World Congress
Place
Rio de Janeiro, BRAZIL
Time
17 September 2006 - 22 September 2006
Website
http://www.metrologia2006.org.br

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