SINE-WAVE SIGNAL SOURCES FOR DYNAMIC TESTING HIGH-RESOLUTION HIGH-SPEED ADCs

Milan Komarek, Vaclav Papez, Jaroslav Roztocil, Petr Suchanek

Abstract

The paper deals with methods of a sine-wave signal generation for dynamic testing high-speed (1 MSa/s to 100 MSa/s) ADCs with high resolution (14 to 20 bits). The techniques of noise and distortion measurement of spectrally-pure sine-wave signals are also discussed.

Keywords

sine-wave signal distortion measurement, dynamic ADC testing

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PWC-2006-TC4-IWADC-003u.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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