UNCERTAINTY ANALYSIS OF THE ADC HISTOGRAM TEST USING TRIANGULAR STIMULUS SIGNALS

F. Corrêa Alegria, A. Cruz Serra

Abstract

This paper addresses the uncertainty of the estimates of ADC testing obtained with the Histogram Method when a triangular stimulus is used. Expressions are presented for the computation of the standard deviation of the transition voltages and code bin widths. These can be used for the Ramp Vernier Test which is a novel test method which will be included in the new version of the IEEE 1057 standard currently in balloting.

Keywords

histogram test, triangular stimulus, ramp vernier test

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IMEKO-IWADC-2007-F135.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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