SOME ERRORS OF ANALOGUE SIGNAL SOURCES FOR ADC EXPONENTIAL STIMULUS HISTOGRAM TEST
Abstract
This paper presents some typical errors of exponential stimulus generated by analog signal sources and their influence on errors of ADC testing by the histogram method. The analysed exponential signals are very close to linear signals such as triangular and sawtooth signals that can be very simply generated by active integrating circuit or passive integrating circuit with long time constant and/or the final voltage far beyond the ADC input range. The experimental measurements of some analogue generators on the market as well as passive and active generating circuit specially designed for the testing were performed. The sources of signal shape errors were investigated and capacitor was determined as the most critical component of generating circuit. The limitations of signal shape error were evaluated and related to the INL test error.
Event details
- Event
- IWADC 2007
- Technical Committee
- TC4
- Place
- Iasi, ROMANIA
- Time
- 19 September 2007 - 21 September 2007