DESIGN-FOR-TESTABILITY IN EMBEDDED MEASUREMENT SYSTEMS

Uwe Frühauf, Hellmut Leuterer

Abstract

Test and self-diagnosis are important for the reliability of embedded measurement systems. For such mixed-signal systems it was introduced any special methods of design-for-testability. This paper will discuss any problems of possible structures by using the analogue Boundary-Scan method and its implementation.

Keywords

design-for-testability, analogue Boundary-Scan, embedded mixed-signal systems

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PWC-2003-TC4-024.pdf

DOI

-

IMEKO TC

TC4 - Measurement of Electrical Quantities

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