An optical technique to measure the induced mechanical strain by a dc electric field in thin organic insulating films

Boubakeur Zegnini, Laurent Boudou, Juan Martinez-Vega

Abstract

An optical noncontact measurement technique based on the tracking of successive positions of computerized markers has been developed which enables one to characterize the electric field induced strain response of the plane gold-metalized surfaces in thin organic insulating films. The test results demonstrate that the newly developed method is capable of detecting displacement of selected markers when the sample is subjected to the application of a dc high voltage. The field-induced mechanical strain measurements have been performed as a function of time and then analyzed with respect to the applied electric field. The observed strain levels varied from ~10^-3 to 10^-2. The differences consisted mainly in the duration of dc electric field, the loading protocols, the thickness and the morphology of tested samples. The analysis of the strain characteristics indicates that this novel measurement technique can indeed be used reliably for giving a clear concept of breakdown mechanisms and aging phenomena in a polymeric material.

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IMEKO-TC4-2007-196.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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