UNCERTAINTY EVALUATION OF MODULUS AND HARDNESS FOR THE NANOINDENTATION MEASUREMENT SYSTEM

Jiong-Shiun Hsu, Sheng-Jui Chen, Hui-Ching Lu, Shear-Shi Pan, Gwo-Jen Wu, Chung-Lin Wu, Chin-fen Tuan

Abstract

The uncertainties of nanoindentation measurement system were evaluated in this paper. A precise electonic balance and an optical interferometric system were respectively utilized to calibrate the force and displacement of nanoindentation measurement system. The uncertainties of reduced modulus and indentation hardness providing from the naoindentaion measurement were respectively obtained.

Keywords: uncertainty, nanoindentation
Download: IMEKO-TC5-2007-004.pdf
DOI: -
IMEKO TC: TC5 - Hardness Measurement

Event details

Event: Symposium on Recent Advancements in the Theory and Practice of Hardness Measurement
Technical Committee: TC5
Place: Tsukuba, JAPAN
Time: 19 November 2007 - 21 November 2007
Website: http://www.hardmeko2007.org

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