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METROLOGICAL SELF-CHECK AND EVOLUTION OF METROLOGY

Roald Taymanov, Ksenia Sapozhnikova

Abstract

Indications of the crisis in the conventional methods of metrological assurance of sensors are analyzed. The analogy between biological and technical evolutions is discussed. It is shown that the near future is mass production of intelligent sensors and systems with metrological selfcheck, as well as the transition to a new stage in evolution of metrological assurance of sensors.

Keywords
sensor, metrological self-check of sensors, long term calibration interval, evolution of metrology
Download
IMEKO-TC1-TC7-2008-027.pdf
DOI
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IMEKO TC
TC1 - Education and Training in Measurement and Instrumentation

Event details

Event
TC1 & TC7 Conference 2008
Technical Committee
TC7
Email
imeko2008@scientific-symposium.com
Place
Annecy, FRANCE
Time
3 September 2008 - 5 September 2008
Website
http://imeko2008.scientific-symposium.com

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