METROLOGICAL SELF-CHECK AND EVOLUTION OF METROLOGY
Abstract
Indications of the crisis in the conventional methods of metrological assurance of sensors are analyzed. The analogy between biological and technical evolutions is discussed. It is shown that the near future is mass production of intelligent sensors and systems with metrological selfcheck, as well as the transition to a new stage in evolution of metrological assurance of sensors.
Event details
- Event
- TC1 & TC7 Conference 2008
- Technical Committee
- TC7
- imeko2008@scientific-symposium.com
- Place
- Annecy, FRANCE
- Time
- 3 September 2008 - 5 September 2008
- Website
- http://imeko2008.scientific-symposium.com