NEW APPLICATIONS OF SHAPE DESIGNED COMPLEMENTARY SIGNALS FOR TESTING OF ANALOG SECTIONS IN ELECTRONIC EMBEDDED SYSTEMS

Dariusz Zaleski, Bogdan Bartosinski, Romuald Zielonko

Abstract

The article concerns the implementation of shape designed complementary signals in BISTs used in mixed-signal embedded systems for testing of their analog sections. The essence of the proposed method is stimulation of the tested circuit with a complementary signal of a designed particular shape, whose parameters are matched to the nominal position of circuit transfer function poles. The paper presents results of simulation research and practical verification of the method in a microsystem based on an ADuC814 microcontroller.

Keywords

electronic embedded systems, complementary signals, Built-In Self-Testers

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IMEKO-TC1-TC7-2008-041.pdf

DOI

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IMEKO TC

TC1 - Education and Training in Measurement and Instrumentation

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