A SELF-TESTING APPROACH TO TESTING OF MIXED ANALOGDIGITAL MICROSYSTEMS BASED ON MICROCONTROLLERS

Zbigniew Czaja

Abstract

A new approach based on the 4D method is proposed to self-testing of analog networks (circuits) of mixed analog-digital microsystems controlled by microcontrollers. It is characterised by simplicity and facility of the implementation of diagnosis algorithms in simple and popular microcontrollers. In the paper the creation of a fault dictionary and self-testing procedures of analog networks (single soft fault detection and localisation) for these microsystems are described.

Keywords

self-testing, diagnosis methods, microsystems, microcontrollers

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PWC-2003-TC4-066.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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