ANALYSIS OF OFFSET FLUCTUATION GENERATED BY TEMPERATURE DEPENDENCY OF 3-AXIS ACCELEROMETER MMA7260QT
Abstract
This paper describes the comparison of a two inertial sensing boards based on Freescale™ accelerometer MMA7260QT. Measurement results have shown that they are dependable on voltage supply. It is known that acceleration measurements depend on interferences and numerous noise sources. We have examined the offset fluctuation/moving bias of two inertial sensing boards generated by temperature and time dependency.
Event details
- Event
- Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
- Technical Committee
- TC4
- Place
- Florence, ITALY
- Time
- 22 September 2008 - 24 September 2008
- Website
- http://www.imeko2008.org/