MEASUREMENT OF LOW FREQUENCY NOISE OF MONOCRYSTALLINE SILICON SOLAR CELLS

Zdenek Chobola, Lech Hasse, Zbynek Ružicka

Abstract

Noise measured across silicon single-crystal solar cells may serve as a non-destructive reliability indicator of the devices. The noise sources in monocrystalline solar cells has been described. The noise measuring system and the results of measurement of circular form cells (a diameter of 100 mm and a thickness of 360 µm) have been presented. The DLTS measurements performed on investigated solar cells approved the noise measurement results.

Keywords

noise measurement, silicon solar cell, reliability

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PWC-2003-TC4-076.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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