SPECTRAL TEST OF DAC USING OVER SAMPLING AND LOW RESOLUTION ADC

Domenico Luca Carnì, Domenico Grimaldi

Abstract

In the paper a new testing method for spectral analysis of DACs is presented. The method requires low resolution high speed ADC to acquire the resulting signal obtained by adding to the output voltage of the DAC under test the periodic voltage with sawtooth shape. The zero crossing time sequence detected in the quantized signal is used to infer the value of the sawtooth voltage and, consequently, that of the output voltage of the DAC. Because the sampled signal is characterised by non-uniform sampling time, the spectral analysis is performed on the basis of a procedure pointed out to overcome the problem concerning the frequency ambiguities in the spectral analysis of non-uniform sampled signal. This procedure permits the reconstruction of the uniformly sampled spectrum by starting from the non-uniformly sampled one. The results of numerical test on 14-bit DAC by using 6 bit ADC were shown. Finally, the advantages of the method respect to another presented in literature, based on low resolution ADC and dithering, are discussed.

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DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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