Skip to main content

TESTING METHOD OF ANALOG PARTS FOR MIXED SIGNAL MICROSYSTEMS BASED ON MICROCONTROLLERS

Zbigniew Czaja

Abstract

In the paper a new method of fault detection and location of a single soft fault in analog parts of mixed signal microsystems based on microcontrollers is presented. The idea of the method bases on the transformation which maps changes of the time response of the tested circuit on a square impulse resulting from changes of values of respective elements onto identification curves on a plane. The method consists of two stages. In the first stage a fault dictionary of an analog part in the form of a family of identification curves is generated and it is placed in the program memory of the microcontroller. In the second stage detection and a location of the fault are carried out.. This method does not require extra hardware in the microsystem. The measuring-diagnosis procedure is realised only by the microcontroller already existing in the microsystem.

Download
IMEKO-TC4-2004-039.pdf
DOI
-
IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
TC4 Symposium 2004
Technical Committee
TC4
Email
imeko@mail.ntua.gr
Place
Athens, GREECE
Download
imeko_tc4_2004_call_for_papers2.pdf
Time
29 September 2004 - 1 October 2004
Website
http://www.medialab.ntua.gr/IMEKO

Back to the proceedings