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INTELLIGENT ANALYSIS OF GENOMIC MEASUREMENTS

I.N. Flaounas, D.K. Iakovidis, D.E. Maroulis, S.A. Karkanis

Abstract

In this paper we propose a methodology for intelligent analysis of genomic measurements. It is based on a sequential scheme of Support Vector Machines and it can be used for class prediction of multiclass genomic samples. The proposed methodology was evaluated using two lung cancer datasets. The results are comparable and in many cases higher to the accuracy of relevant methodologies that have been proposed in the literature.

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IMEKO-TC4-2004-083.pdf
DOI
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IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
TC4 Symposium 2004
Technical Committee
TC4
Email
imeko@mail.ntua.gr
Place
Athens, GREECE
Download
imeko_tc4_2004_call_for_papers2.pdf
Time
29 September 2004 - 1 October 2004
Website
http://www.medialab.ntua.gr/IMEKO

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