FAST ESTIMATION OF A/D CONVERTER NONLINEARITIES

F. Stefani, A. Moschitta, D. Macii, P. Carbone, D. Petri

Abstract

This paper deals with an innovative strategy to shorten the record size required to estimate the Integral Non-Linearity (INL) of Analog-to-Digital Converters (ADC’s) through the so-called Sinewave Histogram Test (SHT). Such a size reduction is achieved by low-pass filtering the collected sequences of test samples using a simple moving average filter. After some preliminary simulations, the validity of the proposed approach have been confirmed by some experimental results.

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IMEKO-IWADC-2004-004.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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