NOISE INFLUENCE ON EXPONENTIAL HISTOGRAM ADC TEST

Jan Saliga, Linus Michaeli, Roland Holcer

Abstract

This paper deals with some error effects caused by additive noise at analog-to-digital converters (ADCs) testing based on the histogram method and the exponential shape of input testing signal. The histogram method with exponential signals has been an alternative test method for ADC developed by the author. Here, the theoretical analysis of some errors in estimation of code bin width and quantisation levels caused by additive input Gaussian noise is performed. The theoretical results are verified by simulations. The acquired results are compared with the analogues ones for sinewave and Gaussian noise input test signals.

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IMEKO-IWADC-2004-019.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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