COMPARISON OF PARAMETERS OF SYSTEMS USED FOR AD CONVERTERS AND MODULES TESTING

Vladimir Haasz, Jaroslav Roztocil , Dominique Dallet, David Slepicka

Abstract

The paper presents results of ADC testing systems comparison between Laboratoire de microélectronique IXL, University Bordeaux and ADCM&T Laboratory, Dept. of Measurement of FEE CTU, Prague. The comparison was performed using transportable reference AD device designed and developed in FEE CTU.

Keywords

ADC testing, reference AD device, comparative measurement

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IMEKO-TC4-2002-008.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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