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DATA PROCESSING AND DITHER ENHANCEMENT OF ADC PARAMETERS – TRENDS, APPLICATIONS, LIMITS

Jan Holub, Olli Aumala

Abstract

There is no noise-free place on Earth. Most of noisy effects are undesirable and unwelcome, especially in measuring technology. However, there are some measuring methods and algorithms using noise for quality enhancement. These processes are usually called dithering. Basic ideas of these methods were partially assumed from audio and video signal processing many years ago. The field of dithering technologies in measurement became large in recent years.

Keywords
dithering, ADC
Download
IMEKO-TC4-2002-009.pdf
DOI
-
IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
TC4 Conference and Workshop 2002
Technical Committee
TC4
Place
Prague, CZECH REPUBLIC
Time
26 June 2002 - 28 June 2002

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