A STATE OF THE ART ON ADC MODELING
Abstract
The state of the art of the research on modelling of analog-to-digital converter-based measuring devices is surveyed. Main topics of modelling are reviewed according to the fields of prevailing scientific interest in metrological research such as quantization models, error models, and correction-aimed models. In these fields, recent developments are analysed with the aim of focusing both the contemporary situation and the imminent trends.
Event details
- Event
- TC4 Conference and Workshop 2002
- Technical Committee
- TC4
- Place
- Prague, CZECH REPUBLIC
- Time
- 26 June 2002 - 28 June 2002