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SYSTEM FOR TESTING ANALOG-TO-DIGITAL CONVERTERS

Daniel Belega

Abstract

This paper presents a system named "ADC TEST" that estimates the static and dynamic parameters of an analog-to-digital converter according to the definitions given in IEEE Standard 1241. One shows the available output graphical pages with theirs information and facilities in a practical testing application.

Keywords
estimation of ADC static and dynamic parameters, testing of ADCs by interpolated fast Fourier transform, windowing
Download
IMEKO-TC4-2002-031.pdf
DOI
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IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
TC4 Conference and Workshop 2002
Technical Committee
TC4
Place
Prague, CZECH REPUBLIC
Time
26 June 2002 - 28 June 2002

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