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A BUILT-IN SELF-CHECK METHOD FOR MULTI-CHANNEL MEASUREMENT SYSTEMS

Vadim Geurkov

Abstract

Signature analysis techniques have become extremely popular in digital systems testing due to such advantages as simplicity, small amount of additional circuitry, and small degree of error masking. In this paper the signature analysis techniques are applied to mixed (analog-to-digital) systems testing. The general case of multi-channel measurement system is considered.

Keywords
BIST, ADC, signature analysis
Download
IMEKO-TC4-2002-032.pdf
DOI
-
IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
TC4 Conference and Workshop 2002
Technical Committee
TC4
Place
Prague, CZECH REPUBLIC
Time
26 June 2002 - 28 June 2002

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