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DEMONSTRATOR FOR RESOLUTION INCREASE AND AUTO-CORRECTION IN EMBEDDED MEASUREMENT SYSTEMS

U. Frühauf, E.-G. Kranz, H. Leuterer

Abstract

For investigation and training of students in the field of high resolution measurement technology was built an embedded measurement system with 16 bit resolution and additional modules for self-diagnostics and autocorrection, including a monitoring measurement system for evaluation.

Keywords
embedded measurement system, autocorrection, evaluation system
Download
IMEKO-TC4-2002-035.pdf
DOI
-
IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
TC4 Conference and Workshop 2002
Technical Committee
TC4
Place
Prague, CZECH REPUBLIC
Time
26 June 2002 - 28 June 2002

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