TESTING ADCs FOR STATIC AND DYNAMIC NONLINEARITIES - KILLING TWO BIRDS WITH ONE STONE

Carsten Wegener, Michael Peter Kennedy

Abstract

Traditionally, static linearity and dynamic distortion tests are performed separately for ADCs. To this end, a low-frequency sinewave is histogrammed to measure static Integral Nonlinearity, and a high-frequency sine-wave is sampled for FFT processing to measure dynamic distortions and dynamic range.<br />We propose to use a model-based technique to extract both static and dynamic nonlinearities from a single data record of a sampled high-frequency sine-wave. This saves test time as the ADC converts fewer samples.

Keywords

ADC testing, histogram, FFT, static and dynamic nonlinearities

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IMEKO-TC4-2002-058.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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