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ON THE EVALUATION OF ADC STATIC PARAMETERS THROUGH DYNAMIC TESTING

M. Comte, F. Azaïs, S. Bernard, Y. Bertrand, M. Renovell

Abstract

Full characterization of ADC requires both a histogram-based approach and a spectral analysis to determine respectively static and dynamic parameters. This paper investigates whether static performances can be extracted from spectral analysis, in order to develop a low-cost test procedure. Results show that under appropriate test conditions, the dynamic parameters extracted from a classical FFT exhibit significant variations against ADC offset and gain errors.

Keywords
ADC testing, static and dynamic parameters, spectral analysis
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IMEKO-TC4-2002-060.pdf
DOI
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IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
TC4 Conference and Workshop 2002
Technical Committee
TC4
Place
Prague, CZECH REPUBLIC
Time
26 June 2002 - 28 June 2002

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