ON THE EVALUATION OF ADC STATIC PARAMETERS THROUGH DYNAMIC TESTING
Abstract
Full characterization of ADC requires both a histogram-based approach and a spectral analysis to determine respectively static and dynamic parameters. This paper investigates whether static performances can be extracted from spectral analysis, in order to develop a low-cost test procedure. Results show that under appropriate test conditions, the dynamic parameters extracted from a classical FFT exhibit significant variations against ADC offset and gain errors.
Event details
- Event
- TC4 Conference and Workshop 2002
- Technical Committee
- TC4
- Place
- Prague, CZECH REPUBLIC
- Time
- 26 June 2002 - 28 June 2002