ECONOMICAL TEST OF INTERNAL ADC IN EMBEDDED SYSTEMS

Josef Vedral, Jakub Svatoš, Pavel Fexa

Abstract

This paper describes two methods for economical test of dynamic parameters ADCs in embedded Data Acquisition Systems. First method is Exponential Fit Test, second method is Wobbler Test. Common testing methods are mentioned as far the accuracy and time necessary for the complete test are concerned. The tests for fast evaluation of the dependence of an effective number of bits on frequency of input signal are described and the comparison of proposed method with the standard methods is given.

Keywords

ADC test, Exponentional Fit Test, Frequency Wobbler test

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IMEKO-WC-2009-TC4-015.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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