DESIGN OF THE PROTOTYPE OF PLD AUTO TEST PLATFORM

Senzu Shen, Hua Li, Zhengle Shi, Minghu Zhang, Qian Liu

Abstract

There're mainly two different situations for testing PLD (Programmable Logic Device) devices. One is testing of blank chips that haven't been programmed; the other is testing of ASIC (Application Specific Integrated Circuit) devices that have been programmed. This paper presents a test method for programmed ASIC devices, including auto test and ATPG (Auto Test Pattern Generation) method for both known and unknown logics of programmed ASIC devices.

Keywords

PLD, auto test, ATPG

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IMEKO-WC-2009-TC4-085.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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