IMPROVING DYNAMIC RESISTANCE AND DIFFERENTIAL CAPACITANCE MEASUREMENT OF ACTIVE DEVICES

Henrique Quaresma, António Pedro Silva, António Serra

Abstract

A numerical model of a general purpose commercial equipment for current versus voltage (I-V) and differential capacitance versus voltage (C-V) measurement of active devices is presented. The good agreement between the model results and experimental data show that the model takes into account the main error sources of the instrument and can be used as a base to perform error correction and to implement a calibration procedure.

Keywords

dynamic resistance, differential capacitance, calibration method

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PWC-2003-TC4-119.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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