STATIC CHARACTERIZATIONS OF ANALOG TO DIGITAL CONVERTER

Patrick Espel, Andre Poletaeff

Abstract

This paper deals with the assessment of the metrological performance of analog-to-digital converters in order to use them in some metrology applications. Hence, digitizers of a commercial DVM have been characterized under DC voltages, with respect of several parameters such as aperture time, dead time and the autozero function.

Keywords: digitizers, aperture time, sampling techniques
Download: IMEKO-WC-2009-TC4-138.pdf
DOI: -
IMEKO TC: TC4 - Measurement of Electrical Quantities

Event details

Event: XIX IMEKO World Congress
Place: Lisbon, PORTUGAL
Time: 6 September 2009 - 11 September 2009
Website: http://www.imeko2009.it.pt/

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