STATISTICAL ANALYSIS OF THE WORD ERROR RATE MEASUREMENT IN ANALOG-TO-DIGITAL CONVERTERS

Marcantonio Catelani, Andrea Zanobini, Lorenzo Ciani

Abstract

The word error rate (WER) in an Analog to Digital Converter (ADC) is the probability to receive a wrong code for an input, after correction is made for gain, offset, and nonlinearity errors, and a specified allowance is made for noise. Typical causes of word errors are metastability and timing jitter of comparators within the ADC.<br />The proposed paper is an evolution of previous work and focuses the attention to the word error rate estimation and to the Annex A of IEEE standard 1241. Other statistical techniques, which can better integrate what is sustained in the standard and in [2], have been proposed. In particular, Chi-square and <i>F</i> distributions have been introduced for a more accurate measurement of the word error rate in the case of n successive observations.

Keywords

Analog to Digital Converter (ADC), IEEE Std 1241, Word Error Rate (WER)

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IMEKO-WC-2009-TC4-204.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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