INFLUENCE OF RADIATION DIFFRACTION UPON METROLOGICAL PARAMETERS OF THE IR LINE SCANNER

Leszek Rozanski, Stanislaw Poloszyk

Abstract

The influence of IR radiation diffraction upon geometrical resolution of the IR line scanner has been analysed in the paper. Analysis of IR line scanner properties in band 3 – 5 µm and 8 – 12 µm proved that when applying the aperture diaphragms the influence of the radiant diffraction upon geometrical resolution may be significant. This influence is stronger for larger <i>f</i> numbers <i>N</i> in the applied optical systems. It was shown that for large values of <i>f</i> numbers the thermal resolution of the IR line scanner can be improved by reducing the bandwidth of the electronic system of the scanner, without considerable deterioration of geometrical resolution.

Keywords

IR line scanner, metrological parameters

Download

IMEKO-WC-2009-TC12-393.pdf

DOI

-

IMEKO TC

TC12 - Temperature and Thermal Measurements

Back to the proceedings