BIAS IN ADC TERMINAL BASED GAIN AND OFFSET ESTIMATION USING THE HISTOGRAM METHOD

F. Corrêa Alegria

Abstract

It is demonstrated that, when using the Histogram Test Method to test an analogue to digital converter, the presence of additive noise in the test setup or in the converter itself causes a bias in the terminal based estimation of the gain but not in the estimation of the offset. This will be demonstrated here by analytically determining the estimation error as a function of the sinusoidal stimulus signal amplitude and the noise standard deviation. A closed form approximate expression will be proposed for the computation of the bias of terminal based gain. The results presented are numerically validated using a Monte Carlo procedure.

Keywords

Analogue to Digital Converter, Histogram Test Method, Estimator Bias

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IMEKO-WC-2009-TC4-472.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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