SINE WAVE SIGNAL SOURCES FOR TESTING HIGH-SPEED HIGH-RESOLUTION A/D CONVERTERS

Vaclav Papez, Jaroslav Roztocil, Stanislav Dado

Abstract

The paper deals with conception of a sine wave signal generation for dynamic testing high-speed (1 MSa/s to 100 MSa/s) analog-to-digital converters with high-resolution (14 to 20 bits). An oscillator designed with respect to minimal phase noise is described.

Keywords

ADC testing, phase noise, SINAD, THD

Download

IMEKO-WC-2009-TC4-484.pdf

DOI

-

IMEKO TC

TC4 - Measurement of Electrical Quantities

Back to the proceedings