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COMPARATIVE ANALYSIS OF DIFFERENT ACQUISITION TECHNIQUES APPLIED TO STATIC AND DYNAMIC CHARACTERIZATION OF HIGH RESOLUTION DAC

Domenico Luca Carnì, Domenico Grimaldi

Abstract

Two acquisition techniques pointed out for the static and dynamic test of high resolution DAC by low resolution ADC are analyzed and compared. These two techniques differ on the basis of the specific approximated evaluation of the DAC output voltage.<br />The interest to the comparative analysis is justified by the aim to separate the influence of the acquisition technique from that of the processing algorithm on the evaluation of the accuracy of the test.<br />The comparing analysis is performed on the basis of the accuracy to reconstruct the output signal of the DAC. The error occurring in the evaluation of the DNL is taken into consideration for the static test. The error occurring in the evaluation of the Spurious Free Dynamic Range is taken into consideration for the dynamic test.<br />Results of the numerical tests to compare the accuracy of the two acquisition techniques are shown and discussed.

Keywords
Digital to Analog Converter, static test, dynamic test, sine fitting, zero crossing
Download
IMEKO-WC-2009-TC4-599.pdf
DOI
-
IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
XIX IMEKO World Congress
Place
Lisbon, PORTUGAL
Time
6 September 2009 - 11 September 2009
Website
http://www.imeko2009.it.pt/

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