IMPLEMENTATION OF HIGH RESOLUTION DAC TEST STATION: A CONTRIBUTION TO DRAFT STANDARD IEEE P1658

Aldo Baccigalupi, Mauro D'Arco, Annalisa Liccardo, Michele Vadursi

Abstract

The paper deals with the implementation of a measurement station for the test of high resolution of Digital-to-Analog Converters (DACs). The basic idea relies on the employment of a differential amplifier that provides a signal related to the difference between the voltage generated by the DAC under test and a reference signal. To solve problems associated to synchronization, the reference signal is gained by treating the DAC output voltage through a narrow band filter. Thanks to the differential amplifier, the difference signal, which holds information about DAC non linearity, is hugely expanded and, thus, can be acquired by means of an Analog-to-Digital converter whose resolution is lower than that of the DAC under test.

Keywords

Digital-to-Analog converter, filters, differential amplifier

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IMEKO-WC-2009-TC4-643.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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