OPTOELECTRONIC PHASE DELAY MEASUREMENT FOR A MODIFIED MICHELSON INTERFEROMETER
Abstract
For the primary calibration of the phase response of accelerometers, the knowledge of the response delay of the reference, i.e. the laser interferometer is a decisive prerequisite. However, an experimental determination of the interferometric response time is not a simple task.<br />This contribution describes an opto-electronic set-up based on a femtosecond laser and originally developed for calibration of high speed sampling oscilloscopes, which enables a precise determination of the intrinsic delay of the photo detectors of a modified Michelson interferometer used at PTB.
Event details
- Event
- TC22 Meeting 2010
- Technical Committee
- TC22
- Place
- Pattaya, THAILAND
- Time
- 21 November 2010 - 25 November 2010
- Website
- http://imeko2010.nimt.or.th/