CALIBRATION OF INSTRUMENT CURRENT TRANSFORMERS WITH ATYPICAL SECONDARY CURRENT

Renata Styblíková, Karel Draxler

Abstract

Methods enabling a determination of errors eI and dI for a high transformation ratio difference between a standard and tested instrument current transformers (ICT) are described in this article. A widespread method uses an automatic transformer test set for the measurement of a difference between a standard and tested ICT. A method transforming secondary currents to voltages and an indirect method using error measurement from magnetizing current are also described.

Keywords

current transformer, errors, lock-in amplifier

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PWC-2003-TC8-008.pdf

DOI

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IMEKO TC

TC8 - Traceability in Metrology

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