THE KRISS PLUS (PULSED LASER-BASED UNIFORM SOURCE) FACILITY FOR MEASUREMENT OF SPECTRAL RADIANCE RESPONSIVITY

Dong-Hoon Lee, Kee Suk Hong, Yong-Shim Yoo, Seongchong Park, Chul-Woung Park, Seung-Kwan Kim, Seung-Nam Park

Abstract

We are developing a pulsed laser-based uniform source facility for measurement of spectral radiance responsivity. By using an optical parametric oscillator, a wide wavelength range from 210 nm to 2500 nm can be covered by a single device. Realization of the two basic concepts based on the pulse-to-pulse data acquisition are presented and discussed.

Keywords

spectral radiance, uniform source, tuneable laser, pulsed OPO

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IMEKO-WC-2012-TC2-O7.pdf

DOI

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IMEKO TC

TC2 - Photonics

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