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THE DESIGN OF REFERENCE MATERIALS FOR AUTOMATED TEST EQUIPMENT(ATE) CALBRATION

Yong Hu, Jian Shi, Qian Liu

Abstract

Reference materials (RMs) are extremely useful in testing and benchmarking instrumentation. In this paper, a kind of IC RMs based on nine parameters is developed. It describes what parameters should be chosen as properties of IC RMs, and presents the circuit structure of RMs in detail. With these programmable parameters of IC RMs, ATE can be traced to national standards.

Keywords
reference materials, ATE calibration, programmable parameters
Download
IMEKO-WC-2012-TC4-P29.pdf
DOI
-
IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
XX IMEKO World Congress
Place
Busan, REPUBLIC of KOREA
Time
9 September 2012 - 12 September 2012
Website
http://imeko2012.kriss.re.kr

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