VIM AND CURRENT TENDENCIES IN MEASUREMENT SCIENCE

A. Chunovkina, K. Sapozhnikova, R. Taymanov

Abstract

Some proposals with regard to the future version of the VIM are given. The proposals concern definitions of the terms "measurement", "nominal property", "metrological traceability", "sensor", "measuring system", etc. A necessity to apply measurements to new fields and take into account new technologies is grounded.

Keywords: VIM, measurement, nominal property, metrological traceability, sensor, measuring system
Download: IMEKO-WC-2012-TC7-O1.pdf
DOI: -
IMEKO TC: TC7 - Measurement Science

Event details

Event: XX IMEKO World Congress
Place: Busan, REPUBLIC of KOREA
Time: 9 September 2012 - 12 September 2012
Website: http://imeko2012.kriss.re.kr

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