THE I-V CHARACTERISTIC COMPARISON METHOD IN ELECTRONIC COMPONENT DIAGNOSTICS

P. Neumann, M. Pospisilik, P. Skocik, M. Adamek

Abstract

I-V characteristics of individual electronic components or electronic circuits have been playing a very important role in diagnostics for many years. The latest technological advance has extended the analytical potential of that method even more. This paper presents some examples how the I-V characteristic comparison can reveal the differences between the chosen approved model component and some other alternative components manufactured by different producers. The differences might be caused also with a treatment history like thermal or electrostatic discharge exposition.

Keywords

I-V characteristic, scan profile, pin print, comparison criteria, model component

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IMEKO-WC-2012-TC10-P2.pdf

DOI

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IMEKO TC

TC10 - Measurement for Diagnostics, Optimization and Control

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