MEASUREMENT OF THE FIGURE-OF-MERIT OF THERMOELECTRIC DEVICES
Abstract
The apparatus for evaluation of the figure of merit (<i>ZT</i>) of thermoelectric devices has been developed. <i>ZT</i> value is comprised of three physical quantities, Seebeck coefficient, electrical conductivity, and thermal conductivity. However, to date, the <i>ZT</i> values of the thermoelectric devices have been evaluated by Harman method due to difficulty in measuring thermal conductivity of the devices with high accuracy. In this study, we present new apparatus developed for evaluating the thermoelectric figure of merit of devices by direct measurement of thermal conductivity using guarded hot plate method.
Event details
- Event
- XX IMEKO World Congress
- Place
- Busan, REPUBLIC of KOREA
- Time
- 9 September 2012 - 12 September 2012
- Website
- http://imeko2012.kriss.re.kr