MEASUREMENT OF EFFECTIVE ELECTRON SOURCE SIZE BY USING NANO-BIPRISM

B. Cho, Y. Cho, S. Ahn, H. Lee, B. Park, C. Hwang

Abstract

The spatial coherence length of electron beam was measured by using multi-walled carbon nanotubes as an element of a nano-biprism. With decreasing the source temperature from 300 K to 78 K, the visibility of the interference fringe of emitted electrons increases by a factor of 3, and the band of the interference pattern widens by a factor of 5.

Keywords

coherence length, electron beam, biprism

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