CHARACTERIZATION OF MAGNETIC PROBES USING SCANNING ELECTRON MICROSCOPY WITH POLARIZATION ANALYSIS

Wondong Kim, Sangsun Lee, Chanyong Hwang

Abstract

We developed scanning electron microscopy with polarization analysis (SEMPA) system and utilized it to characterize the local magnetic probes used in the magnetic microscopy based on the scanning probe method. With a specially designed reference sample we could determine the Sherman function of spin detector and the uncertainty in measurement of spin polarization. Based on the measurement procedure established with the reference sample, we could characterize the local magnetic probes by measuring the magnetic domain images and the spin polarization of the magnetic probes.

Keywords

scanning electron microscopy with polarization analysis, spin polarization, magnetic probe

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