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ULTRA-LOW NOISE TWO CHANNEL NOISE MEASUREMENT SYSTEM

A. Konczakowska, L. Hasse, L. Spiralski

Abstract

The computer-controlled system for low-frequency noise measurements has been presented. All major functions for adequate polarisation of a device under test are programmable providing complete flexibility and automation for biasing. The inherent noise parameters of the main modules are enclosed. The system enables to measure input-output noise relations for BJTs, JFETs, MOSFETs, MESFETs, HEMTs, and, in general, also other two-ports.

Keywords
low-frequency noise, noise measurements, low- noise preamplifiers, automation of noise measurement
Download
IMEKO-WC-2000-TC4-P136.pdf
DOI
-
IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
XVI IMEKO World Congress
Place
Vienna, AUSTRIA
Time
25 September 2000 - 28 September 2000

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