ULTRA-LOW NOISE TWO CHANNEL NOISE MEASUREMENT SYSTEM
Abstract
The computer-controlled system for low-frequency noise measurements has been presented. All major functions for adequate polarisation of a device under test are programmable providing complete flexibility and automation for biasing. The inherent noise parameters of the main modules are enclosed. The system enables to measure input-output noise relations for BJTs, JFETs, MOSFETs, MESFETs, HEMTs, and, in general, also other two-ports.
Event details
- Event
- XVI IMEKO World Congress
- Place
- Vienna, AUSTRIA
- Time
- 25 September 2000 - 28 September 2000