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CONSIDERATIONS ON NANOHARDNESS MEASUREMENT

Z. Rymuza, M. Misiak, J. T. Wyrobek

Abstract

Measurement of hardness on nano-scale is discussed. Methods and instruments used are described and energy definition of hardness is introduced. Results of nanohardness measurements of materials, in particular ultrathin films,used in Micro Electro Mechanical Systems (MEMS) technology are presented.

Keywords
hardness, nanohardness measurement, MEMS materials
Download
IMEKO-WC-2000-TC5-P171.pdf
DOI
-
IMEKO TC
TC5 - Hardness Measurement

Event details

Event
XVI IMEKO World Congress
Place
Vienna, AUSTRIA
Time
25 September 2000 - 28 September 2000

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