METROLOGICAL CHARACTERISATION OF TIME-FREQUENCY AND TIME-SCALE ANALYSERS

V. Belotti, F. Crenna, R. C. Michelini, G. B. Rossi

Abstract

The coupled time-frequency and time–scale analysis are more and more applied in the most different fields, and they are becoming a standard component of the measurement chain. To properly design a measurement chain, the metrological characteristics of the processing has to be known as for all other components such as sensors and conditioners. On these premises a systematic investigation of the metrological properties of the processing techniques considered is carried out, by applying the analysers to a set of properly designed synthetic test signals and by evaluating the result through subjective judgement by a jury. Results of the investigation are presented, giving guidelines for application.

Keywords

time-frequency analysis, wavelet analysis, metrological properties

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IMEKO-WC-2000-TC7-P178.pdf

DOI

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IMEKO TC

TC7 - Measurement Science

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