INTERFERENCE ANALYSIS OF A LOW CURRENT MEASURING SYSTEM

F. Dietrich, U. Frühauf, E.-G. Kranz, H. Leuterer

Abstract

Low current measurements are necessaries to characterise modern electronic components and for the investigation of different physical and bioelectrical effects. The currents are mostly in the region of a few picoamperes to some femptoamperes within temperatures between – 60 °C and above 200 °C. Special difficulties are caused by several parasitic effects, influenced by the design and the applied materials of the measuring system. The presented paper separates and examines these effects. The measured results are compared with the simulations. The analysis of the results give technical conditions how to avoid these interferences and how to improve the design of low current measuring system.

Keywords

measurement system, interference analysis, low current

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IMEKO-WC-2000-TC7-P181.pdf

DOI

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IMEKO TC

TC7 - Measurement Science

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