THE FAULT LOCATION ALGORITHM BASED ON TWO CIRCUIT FUNCTIONS
Abstract
The paper presents an algorithm for detection and location single parametric faults in analogue electronic circuits based on making use of input-output measurements. It utilises two circuit functions (for instance: voltage transmittance <i>K</i><sub><i>U</i></sub> and input opened admittance <i>Y</i><sub>in</sub>) measured on the same frequency for the fault location. Each of circuit functions is regarded as bilinear transformation. When we put together these transformations into a three-dimensional space (for instance: <i>Re</i>(<i>K</i><sub><i>U</i></sub>), <i>Im</i>(<i>K</i><sub><i>U</i></sub>), |<i>Y</i><sub>in</sub>|) it is wrested a family of curves representing the changes of respective elements' values. This composition causes increasing selectivity of the fault location, because the curves do not cut themselves and furthermore they are more separated, than it has place in classical applications of bilinear transformation. The algorithm consists of two parts. First part is aimed at determination of the optimum measuring frequency for a simultaneous measurement of two circuit functions. Second part achieves the fault location. It was chosen 3-order low-pass Butterwoth Filter to verify the algorithm.
Event details
- Event
- XVI IMEKO World Congress
- Place
- Vienna, AUSTRIA
- Time
- 25 September 2000 - 28 September 2000